Solar Thin Film Measurement
Nanometrics launches metrology tool that integrates into thin film solar manufacturing to control and manage film thickness preventing process upsets. ...
... "The latest in Nanometrics’ Trajectory product line, the TSM is designed to rapidly measure the thickness of various thin films in order to enable fast feedback and excursion prevention in the manufacture of all types of solar photovoltaic (PV) cells, and further expands Nanometrics’ metrology system footprint into the segment of rough and textured PV film layers. " ...Via Nanometrics: Metrology System for Solar PV Applications